X-ray fluorescence (XRF) spectrometers ZSX Primus II
Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
  1. Features
  2. Specification

Tube above optics for superior reliability

ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.

Low-Z performance with mapping and multi-spot analysis

Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

SQX fundamental parameters with EZ-scan software

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

Features

  • Analysis of elements from Be to U
  • Tube above optics minimizes contamination issues
  • Small footprint uses less valuable lab space
  • Micro analysis to analyze samples as small as 500 µm
  • 30μ tube delivers superior light element performance
  • Mapping feature for elemental topography/distribution
  • Helium seal means the optics are always under vacuum

 

General

 

Elemental coverage

4Be through 92U

 

Optics

Wavelength dispersive, sequential, tube above

X-ray generator

 

X-ray tube

End window, Rh-anode, 3kW or 4 kW, 60kV

 

HV power supply

High frequency inverter, ±0.005% stability

 

Cooling

Internal water-to-water heat exchanger

Spectrometer

 

Sample changer

48 positions standard, 96 optional

 

Sample inlet

APC automatic pressure controller

 

Maximum sample size

51 mm (diameter) by 30 mm (high)

 

Analysis sample area

35 mm (diameter)

 

Sample rotation speed

30 rpm

 

Primary X-ray filters

Al, Ti, Cu and Zr

 

Beam collimators

6 auto-selectable diameters: 35, 30, 20, 10, 1 and 0.5 mm

 

Divergence slit

3 auto-selectable: standard, high, and course (optional) resolutions

 

Receiving slit

For SC and for F-PC detectors

 

Goniometer

θ – 2θ independent drive mechanism

 

Angular range

SC: 5-118°, F-PC: 13-148°

 

Maximum scan speed

1400°/min (2θ)

 

Angular reproducibility

±0.0005°

 

Continuous scan

0.1 - 240°/min

 

Crystal changer

10 crystals, automatic mechanism

 

Vacuum system

2 pump high-speed system w/ (optional) powder trap

 

He flush system

Optional, with partition

 

Temperature stabilizer

36.5°C ± 0.1°C

Detector systems

 

Heavy element detector

Scintillation counter (SC)

 

Light element detector

Flow proportional counter (F-PC)

 

Attenuator

In-out automatic exchanger (1/10)