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The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.
Features

Engineered for Performance

The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.

Designed for Flexibility

Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

Functionality Redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

Features:

  • Full automated alignment under computer control.
  • Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
  • Focusing and parallel beam geometries without reconfiguration.
  • SAXS capabilities

 

Specification

Sealed tube generator

Maximum rated output

3 kW

Rated tube voltage - current

20 - 60 kV; 2 - 60 mA

Stability

Within ±0.005% for 10% input power variation

Target

Cu (others: optional)

Focus size

0.4 x 12 mm line/point (others: optional)

Radiation enclosure

Full safety shielding with failsafe open/close mechanism

Rotating anode generator

Maximum rated output

9 kW

Rated tube voltage - current

20 - 45 kV; 10 - 200 mA

Stability

Within ±0.005% for 10% input power variation

Target

Cu (others: optional)

Focus size

0.4 x 8 mm line/point

Radiation enclosure

Full safety shielding with fail safe open/close mechanism

Goniometer

Scanning mode

θs/θd coupled or θs, θd independent optical encoder controlled

Goniometer radius

300 mm

Minimum step size

0.0001°

Eulerian cradle

χ: -5 to 95°/0.001° step

φ: -720 to 720°/0.002° step

Ζ: -4 to 1 mm/0.0005 mm step

Optional X, Y stages: 20 mm/0.0005 mm step, 100 mmφ/0.0005 mm step, 150 mmφ/0.0005 mm step

Optional Rx, Ry stage: -5 to 5°/0.002° step

Sample size

Max. 200 mmφ x 6 mm thick (24 mm thick, optional)

Optics

Incidence optics

CBO, Ge 2-bounce and 4-bounce monochromators, automatic variable divergence slit

Receiving optics

Automatic variable scattering slit PSA, Ge 2-bounce analyzer, automatic variable receiving slit

Detector

Scintillation counter

Scintillator NaI, photomultiplier with preamplifier

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