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Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal standards.
Features

Tube above optics for superior reliability

ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.

High precision sample positioning

The high precision positioning of the sample ensures that the distance between the sample surface and X-ray tube is kept constant. This is important for applications that require high precision, such as the analysis of alloys. ZSX Primus III+ performs high-precision analysis using a unique optical configuration designed to minimize errors caused by non-flat surfaces in samples such as fused beads and pressed pellets

SQX fundamental parameters with EZ-scan software

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

Features

  • Analysis of elements from O to U
  • Tube above optics minimizes contamination issues
  • Small footprint uses less valuable lab space
  • High precision sample positioning
  • Special optics reduce errors caused by curved sample surfaces
  • Software tools for statistical process control (SPC)
  • Evacuation and vacuum leak rates can be optimized for throughput

Specification

General

 

Elemental coverage

8O through 92U

 

Optics

Wavelength dispersive, sequential, tube above

X-ray generator

 

X-ray tube

End window, Rh-anode, 3kW, 60kV

 

HV power supply

High frequency inverter, ±0.005% stability

 

Cooling

Internal water-to-water heat exchanger

Spectrometer

 

Sample changer

48 positions standard, 96 optional

 

Maximum sample size

51 mm (diameter) by 30 mm (high)

 

Analysis sample area

35 mm (diameter)

 

Sample rotation speed

30 rpm

 

Primary X-ray filters

Al, Ti, Cu and Zr

 

Beam collimators

4 auto-selectable diameters: 35, 30, 20 and 10 mm

 

Divergence slit

3 auto-selectable: standard, high, and course (optional) resolutions

 

Receiving slit

For SC and for F-PC detectors

 

Goniometer

θ – 2θ independent drive mechanism

 

Angular range

SC: 5-118°, F-PC: 13-148°

 

Maximum scan speed

1400°/min (2θ)

 

Angular reproducibility

±0.0005°

 

Continuous scan

0.1 - 240°/min

 

Crystal changer

10 crystals, automatic mechanism

 

Vacuum system

High-speed system

Detector systems

 

Heavy element detector

Scintillation counter (SC)

 

Light element detector

Flow proportional counter (F-PC)

 

Attenuator

In-out automatic exchanger (1/10)

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